TCII / TCIII-1600IC NAND / NOR Flash Tester

Next generation system for IC testing

The TCII-1600IC comes wit 16 DUTs and the TCIII-1600IC comes with 16 or 64 DUTs. 16 or 64 DUTs can be tested in parallel to provide faster production. Error logging on Block/Page/Column and DQ's is also available. An optional handler interface allows the tester to communicate to a handler that perform ICs sorting and binning after testing.

 

Configurable for testing 16 / 64 IC's in parallel and at speed

Empower your business with advanced technology

 

NANDFlash IC

  • 2D NANDFlash speeds up to 800Mbps
  • 3D NANDFlash speeds up to 800Mbps
 

DDR IC

  • DDR3 - PC6400 (800Mbps), PC8500 (1066Mbps), PC10664 (1333Mbps) & PC12800 (1600Mbps)
  • DDR2 - PC3200 (400Mbps), PC4300 (533Mbps), PC5300 (667Mbps) & PC6400 (800Mbps)
 
 
 

eMMC Function

Essential Tools

 

DC Function: Power short and Leakage test

 

AC Function:

  • CID (Device identification) register read
  • CSD (Device-Specific Data) register read
  • Extended CSD register read
  • User area erase
  • User area data write - Single block write & Multiple-block write
  • User area data read - Single block read & Multiple-block read
  • Supports HS200 and HS400 mode
 

Other (optional):

  • Supports LPDDR3, LPDDR2, SDRAM, NORFlash, pSRAM (Pseudo SRAM), eMMC / eMCP / MCP
  • Operating clock frequency from 200Mhz to 800Mhz
  • Configurable for testing 16 or 64 IC's, in parallel & at speed
  • IC components and custom test socket load boards
  • Supports open/shorts testing
  • Supports leakage tests for IC testing
  • Supports AC/DC parametric
  • Supports integrate the use with Signal Tap software
  • Over 35 built in "industrial standard" & "standard MB program," AC patterns
  • User defined script code test pattern programming
  • Error logging up to 64 locations of Row/Column/BA/Burst/DQ's
  • Heat chamber for hot environmental testing from 32°C to 85°C (optional)
 
 

NEW ! Considering an upgrade to DDR4 / 2133Mbps?

Have you considered upgrading the technology for your memory testing environment? Learn more about TurboCATS NEW TurboCATS III-2133IC DDR4, LPDDR4 up to 2133Mbps and DDR3, LPDDR3 up to 1866Mbps test system.

 
 
 

Script Code Function Optional

Traditional test systems provide the user with a variety of AC test patterns to use in their testing process. If a customer wanted the capability to generate a proprietary test pattern, they would have to purchase a high-end automated test system. For most companies this is cost prohibitive and not a viable option.

TurboCATS introduces the new feature called "Script Code" in its new test system, the TCII/TCIII-1600IC. The customer can now use the script programming language to create a customized test pattern. Once the pattern is created, the "Script Code" pattern generator/compiler is used to compile the code, then generate the new test pattern.

 

Script Code Debugger

 

The "Script Code" function also contains a built-in compiler and debugger for the "Script Code" programming, which allows the customer to monitor the timing waveform of the programming algorithm as well as the timing bus transactions. This is all accomplished under the "Signal Tap" tool.

The new pattern is then imported into the test list and gives the customer a customized pattern with AC (tSU, tWD, tSAC, tRCD, tCL, tAL, tWR, tRP, tRC, tREF, tRFC, etc.) and DC (Vdd, Vref) parameters for testing their product. Additionally, the customer can also create a motherboard test pattern algorithm using the "Script Code" function. The TCII/TCIII-1600IC performs the test with no-wait states in the operating system.

Utilizing the "Script Code" function gives the customer a high degree of flexibility in terms of timing bus programming for creating unique Read and Write programming transactions under best and worst case AC parameters scenarios. This can also be used to create a no-wait state bus transaction in the Read to Write cycle.

 
 

Powerful Integration

 
 
  1. Script Code Function
    • Older TurboCATS test system models provided a wide variety of AC test patterns but did not allow the user to generate a proprietary test pattern. The new TCII/TCIII-1600IC offers the "Script Code" feature. This will let the end user program proprietary test patterns.

    • By utilizing the script programming language, the customer can create a customized test pattern, then use the Script Code pattern generation compiler to compile and to generate the new test pattern. Afterwards, the new pattern is imported into the test list with AC (tADL, tALH, tALS, tCH, tCS, tAR, tRC, tR, tBERS, tPROG, etc) and DC (Vforce, Vcc) parameters for customized testing.
     
  2. Enhanced Timing Bus
    • Script Code programming gives the end user a high degree of flexibility in programming the timing bus to create a unique Read and Write bus transaction under best and worst case AC parameters. Additionally, a no-wait state bus transaction can be created in the Read to Write cycle.
     
  3. Powerful Debug/Compiler Tool
    • A built in compiler and debugger environment is in the Script Code programming. This allows the user to monitor the timing waveform of the programming algorithm and the timing bus transactions under the Signal Tap tool.
 
 

Heat Chamber Optional

 
ICs can be tested under a programmable temperature condition with a heat chamber option.
 
  • Seven-segment Temperature Display
  • Temperature Setting Option
  • Temperature Range (85°C - Room Temperature)
  • Pneumatic Control System
  • Automatic level-control, manual operation not required
 
 
 

Combination of Failures

 
  1. Functional Failure: Cell stuck-at, coupling, neighborhood sensitivity and software error faults.
  2. Parametric Failure: (AC) Speed timing vs. Vdd threshold, (DC) Leakage and Idd's.
  3. Hot-Temperature Failure: System high temperature environment.
 
 
 

FEATURES

 

DDR3 / LPDDR3 / DDR2 / LPDDR2 / DDR1 / SDRAM / pSRAM:

 
  • Supports AC/DC/Icc parametric tests
  • Over 35 industry standard AC test patterns available
  • Supports open and shorts/leakage for IC testing
  • Supports Auto Calibration
  • User-defined script code test pattern programming
  • Specific Application Test (S.A.T.) function (optional)
  • Hot chamber and handler interface (optional)
 

eMMC Function

DC Function: Power short and Leakage test

AC Function:

  • CID (Device identification) register read
  • CSD (Device-Specific Data) register read
  • Extended CSD register read
  • User area erase
  • User area data write - Single block write & Multiple-block write
  • User area data read - Single block read & Multiple-block read
  • Supports HS200 and HS400 mode
 

NandFlash:

 
  • 2D NANDFlash speeds up to 800Mbps
  • 3D NANDFlash speeds up to 800Mbps
  • Supports AC/DC/Icc parametric tests
  • Built in Icc patterns include sequential read operating current, progra
  • Operating current, erase operating current and stand-by current (TTL)
  • Supports both large block and small block architecture
  • Supports Block / Page / Column modes
  • Supports cache read, sequential read and copy back
  • Supports Leakage pin and Continuity test
  • Flexible bad block management available for read bad block
  • Over 35 industry standard AC test patterns available
  • Over 20 AC timing parameters for AC parametric testing (Async)
  • Over 15 AC timing parameters for AC parametric testing (Sync)
  • Over 30 AC timing parameters for AC parametric testing (Toggle)
  • User Script Code programming for customized test patterns (optional)
 

CFI NorFlash:

 
  • Supports AC/DC/Icc parametric tests
  • Built in Icc patterns include read operating current, program operating current, erase operating current and stand-by current
  • Supports both top boot and bottom boot architecture
  • Supports Block/Column modes
  • Supports 12V fast production programming
  • Over 15 industry standard AC test patterns available
  • Over 15 AC timing parameters for AC parametric testing
 

SPI NorFlash:

 
  • Supports AC/DC/Icc parametric tests
  • Built in Icc patterns include block erase, fast read, page program and stand-by current
  • Supports serial 1x, 2x, 4x and parallel I/O mode
  • Supports both SDR and DDR
  • Over 10 industry standard AC test patterns available
  • Over 15 AC timing parameters for AC parametric testing
 

Minimum PC Requirements:

Windows 7 or later and networking interface

 

Test Unit Dimensions (WxDxH):

40" (1000mm) x 24" (600mm) x 14" (360mm)

 

AC Power Supply:

110 -240 VAC, 50/60 Hz

 
 
 

Software Screenshots

  • Main Operating Window

  • Script Code Program
 

  • Signal Tap Tool

  • Security Privilege