The TCIII-21UPS Die Probing Station

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Testing Capabilities

Built to Fit your Memory Testing Needs

  • DDR3 / DDR4
  • LPDDR2 / LPDDR3 /LPDDR4
  • NAND Flash
  • Supports speeds up to 400Mbps

How It Works

  • Supports high productivity and enhances efficiency of the handler system
  • 2 work zones
  • Supports semi-automated Die Handler with TurboCATS series
  • Operator loads die on buffer plate and starts the test
  • Prevents Probe Card damage during load and unload operations
  • Prevents contact fail due to improper alignment

Power Up with the Semi-Automated Die Handler

All-In-One Design

Features & Specifications

DDR3 / DDR4:

  DDR3 DDR4
Test Frequency Speed up to 200MHz
Switching Data Rate Speed up to 400Mbps
I/O Interface SSTL-15, Class I & Class II
SSTL-135, Class I & Class II
POD12-1.2V Pseudo Open
Drain I/O
Clock Lines 1 pair
Address Depth 16 Rows, 15 Columns, 3 BAs
16X/15Y/3Z per site
17 Rows, 15 Columns, 4 BAs
17X/15Y/4Z per site
Data Width, Depth 8 I/O, Supports 8 /16 / 32 bit IC devices
Control 2 CS's, 2 CLKE, 1 RAS, 1CAS, 1WE
Termination On chip, dynamic
Variable Timing Edges tSU/tHD, tWD, tDQSS, tAC, etc
Programmable Timing tRCD, tRP, tCL, tAL, tCWL, tWR, tRL, tWL, tRFC, etc.
1 pair of clock per IC socket

LPDDR2 / LPDDR3:

  LPDDR2 LPDDR3
Test Frequency Speed up to 200MHz
Switching Data Rate Speed up to 400Mbps
I/O Interface 1.2V HSTL Class 1.2V HSUL
Clock Lines 1 pair
Address Depth 14 Rows, 10 Columns, 3 BAs 16 Rows, 15 Columns, 3 BAs
Data Width, Depth 8 I/O, Supports 8 /16 / 32 bit IC devices
Control 2 CS's, 2 CKE, 10 CA
Termination On-chip, dynamic
Variable Timing Edges tSU/tHD, tWD, tDQSS, tAC
Programmable Timing tRCD, tRP, tWR, tRL, tWL, tRC, tRTP, tRFC, etc.
1 pair of clock per IC socket

NAND Flash:

Test Frequency Supports 100 and 200MHz
Switching Data Rate Supports 200 and 400Mbps
I/O Interface ONFI 1.0, ONFI 2.0, ONFI 3.0, Toggle NANDFlash
Control Async: CE#, R/B#; RE#, ALE, WP#, CLE, WE#
NV-DDR: CE#, R/B#; W/R#, ALE, WP#, CLE, CLK, DQS
NV-DDR2: CE#, R/B#, CLE, ALE, RE, WR, WP#, DQS
Variable Timing Edge tDS, tDH
Programming Timing Async: tCLS, tCLH, tALS, tALH, tWP, tWH, tDS, tDH, tWC, tADL, tCH, tWW, tCS, tRP, tRC, tREA, tRR, tOH, tWHR, tAR, tWB, tREH, tRHW, tWHR2, tBERS, tR, tPROG
NV-DDR: tADL, tCAD, tCALS, tDS, tCCS, tDQSCK, tDQSS, tRHW, tWB, tWHR , tWW, tWPRE, tWPST, tBERS, tPROG, tR
NV-DDR2: tADL, tCALS, tCALH, tCS, tCH, tAR, tRR, tWB, tWHR, tWC, tWP, tWW, tWHR2, tWPRE, tCAS, tCAH, tCDQSS, tCDQSH, tWPST, tWPSTH, tRPRE, tDQSRE, tRPST, tRPSTH, tBERS, tR, tPROG
DC Tests DC Open, Shorts/Leakage, Idds Measurement
System and Software Features DC & AC Parametric Test:
  • User defined script programming for AC/DC parametric tests
  • Over 35 industry standard test patterns for end users
  • Auto timing calibration
  • VSIM (Contact open pins & Leakage current) optional
GUI Failure Analysis Tool:
  • Graphical identification of Failed ICs and DQs at Hardware level
  • Error logging up the 8192 locations of Row/ Column/ BA/ Burst/ DQs
  • Bitmapping and Shmoo Plot tool are available for showing the status of the Failed DQ bits in the ICs
  • Address/ Data Scrambling allows user to redefine an address line; determine write data or/ data on input address
Flexible Configuration : Configurable from 6 to 512 sites for parallel test on production floor.
  • Supports custom load boards for manual test & non-HiFix handler
  • Supports None-Cable HiFix that can be integrated with a selection of handlers' interfaces
Semi-Automated Die Handler:
  • High productivity and enhanced efficiency
  • Prevents Probe card damage during load and unload operation
  • Prevents contact fail due to improper alignment
Control PC Windows 7 operating system (64 bit) or better, Networking interface
AC Power Source 110-240VAC, 50/60Hz
External PC Requirement Executes software to control station operation.
Windows 7 operating system (64 bit) or better, i7-core or above, 8G RAM or above, CD ROM, LAN port x2, USB port, monitor with 1920 x 1080 resolution or higher, keyboard, mouse, display card or on-board display
Temperature Limitation 16°C to 32°C (60.8°F to 89.6°F)
Humidity Limitation 20% to 80%

Software Screenshots

Main Operating Window

Test Device Configuration

Edit Device Page

Security Privilege

TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.