TCE-3200 DDR4/3 Module Test System

At Bus Speed and High Bandwidth Switching Data Rate


Powerful Testing Capabilities in a Compact Design

Testing DDR4 memory at enhanced bus speed is something that test engineers would like to see in their memory test system. Manufacturers of memory devices continue to stress the importance of reducing the costs to manufacture modules while maintaining test integrity.

Low cost and high-performance are two phrases you typically do not see associated with memory test systems. This all changes with TurboCATS TCE-3200 module test system. With the single-site and at speeds of up to 3200Mbps, the test system is equipped with industry-standard features essential for memory productivity. TCE-3200 is backward compatible and can also test DDR3 products at speeds of up to 1866Mbps. This feature is available by simply swapping out the DDR4 passive test adapter with the DDR3 passive test adapter and downloading the appropriate software.

Customizable Options:

  • DDR4 - supports speeds up to 3200Mbps
  • DDR3 - supports speeds up to 1866Mbps
  • Custom form factor - supports LODIMM, SODIMM, UDIMM, RDIMM, LRDIMM
  • Capable of testing up to 8 units in parallel at speeds up to 3200Mbps

Features like "At Bus Speed Testing" and support for "High Data Rate Switching" are now standard functions in the new TCE-3200 module test system. Open/Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to ensure that the products they sell meet the standards of the PC industry. TCE-3200 is the answer to cost-effective, high performing DDR4 and DDR3 testing for all levels. Repair shops, system integrators, resellers, VARS/VADS, production floors, etc. now have a viable choice when it comes to testing high speed memory modules.

TCE-3200 and Heat Chamber (optional)

Functionality Meets Affordability

Speeds continue to increase in the ever-changing memory market. Moreover, customers want this speed packed in smaller units. The faster the speed is generated, the more heat will be produced, therefore becoming a major challenge in the tester's performance.

TurboCATS has innovated a new heat chamber that can be integrated with the TCE-3200 DDR4 and DDR3 module test system. This allows for a module and its components to be tested for functionality while being exposed to similar heat conditions to the temperature within a PC laptop. This optional item is available with the single site TCE-3200 module test system.


Power Supply 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption Power-up: 3A, 220V
Normal operation: 1.3A, 220V
Display Method Red 7 Segment LED Display
Storage Temperature -20°C - 60°C
Ambient Humidity 35% - 85% RH
Temperature Range 25°C - 85°C

Fully Configurable to Fit your Operational Requirements

Network Interface with up to 8 Units

Simple Setup, Ease of Management

  • Ideal for powered productivity
  • Share effectively and networking
  • Real-time configuration and monitoring
  • Graphical user interface software
  • Free firmware upgrades
  • Optional heat chamber
  • Optional handler interface


Test Capabilities

DDR4 tests data bandwidth up to 3200Mbps
DDR3 tests data bandwidth up to 1866Mbps
Clock frequency from 667MHz to 1600MHz
Supports high bandwidth data switching
Enhanced bus cycles at speed testing

Parametric Test & Analysis Test

Supports DC/Idd's/SPD test
SPD program/test/read, byte matching, write protection, slot test and serialization
Open/Shorts plus 10 comprehensive AC patterns
Real time Idd monitoring
Vdd shorted protection
Failed ICs and DQs, Error logging and location

Flexible Configuration

Supports DDR3L (Low voltage DDR3)
Unbuffered and Registered DIMM's
Optional Form-factor adapters
Network interface with up to 8 units


DDR4 clock frequencies: 800 to 1600 MHz
DDR4 data rate: 1600, 1866, 2133, 2400, 2667, 2866, 2933, 3200 Mbps
DDR3 clock frequencies: 667 to 933 MHz
DDR3 data rate: 1333, 1600, 1866 Mbps
DDR4 Vdd - 1.14V to 1.30V
DDR3L Vdd - 1.25V to 1.45V
DDR3 Vdd - 1.35V to 1.65V
Data width: 72 bits in parallel
Address depth: DDR4 - 18 Rows, 15 Columns, 4 BAs
 DDR3 - 16 Rows, 15 Columns, 3 BAs
Programmable timing cycles : tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC, etc.
Burst Length: 8
ODT Selection
OCD Adjustment: Auto calibration
All Standard Idd's current test

Software Screenshots:

Quick Test (default by factory)

Test Device Configuration

SPD Data

Security Privilege

TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.