Introducing the Powerful TCIII-3733LPIC Test System

At Speed Test Up to 3733Mbps

TurboCATS is pioneering a high performing TCIII-3733LPIC test system. The TCIII-3733LPIC test system comes with two additional new major features: AC switching noise simulation on the LPDDR4/4x, and rubber socket option that can lead better test yield while requiring less maintenance. The test system brings a unique combination of performance and affordability to the memory semi-conductor industry. The test system can handle up to 128 devices, which offers high-production throughput. We also offer a handler interface option in sorting and binning for the test system.

Customizable features:

  • LPDDR4 - 1600Mbps, 2133Mbps, 2400Mbps, 2667Mbps, 3200Mbps, 3733Mbps
  • LPDDR3 - 1066Mbps, 1333Mbps, 1600Mbps, 1866Mbps, 2133Mbps
  • Configurable from 4-site to 128-site for parallel testing
  • Clock frequency from 533MHz to 1866MHz
  • Optional heat chamber and rubber-socket handler docking
  • Proper chassis design to meet various selective handlers requirement

What is Rubber Sockets?

Breakthrough High Speed Testing Technology

  • Support high speeds up to 16GHz
  • Support a wide-range temperature
  • A better yield with non-damaging solder balls on DUTs
  • Less maintenance is required
  • More flexibility for finer pitch capability

eMCP Function

eMMC + LPDDR4/ LPDDR3

  • LPDDR4/LPDDR3 and eMMC are tested Interactively or individually by different adaptor boards
  • Interactive Test by eMCP(LPDDR4/4x + eMMC) DUT board
    1. - DC Patterns test: LPDDR4/4x ONLY
      - Device Functional test: LPDDR4/4x and eMMC
  • Individual Test by eMMC DUT board
    1. - DC Patterns test: eMMC ONLY
      - Device Functional test: eMMC ONLY
  • Supports eMMC formatting flow for eMMC card settings
  • Easy to reconfigure different types of packages and devices

Multi-Site Networking

Solutions for your Connected Testing

The TCIII-3733LPIC (LPDDR4/LPDDR3) IC test system can be networked so the user can test up to 128 devices using one PC to control the entire operation. This gives the customer greater flexibility in terms of increasing testing capacity on an as-needed basis.

GCOM-6040 IC Handler Interface (optional)

Supports LPDDR4/ LPDDR3

  • Testing up to 40 parallel test DUTs
  • Supports different types of ICs, run in automation test
  • Drag and drop operation
  • Extremely intuitive software GUI

Features

Testing Capabilities

  • LPDDR4 - 1600Mbps, 2133Mbps, 2400Mbps, 2667Mbps, 3200Mbps, 3733Mbps
  • LPDDR3 - 1066Mbps, 1333Mbps, 1600Mbps, 1866Mbps, 2133Mbps
  • Clock frequency from 533MHz to 1866MHz

Flexible Configuration

  • Configurable from 4-site to 128-site for parallel testing
  • Proper chassis design to meet various selective handlers requirement
  • Optional environmental tests high temperatures ranging from 25˚C to 125˚C
  • Supports speed tests from 1600Mbps to 3733Mbps for LPDDR4/4x
  • Optional heat chamber and rubber-socket handler docking

GUI Failure Analysis Tool

  • Failed IC's and DQ's
  • Error Logging
  • Bit Mapping
  • Shmoo Plot
  • Eye Diagram

DC & AC Parametric Tests

  • Supports VSIM
  • Continuity, Leakage, Idd's measurement
  • Over 35 industry standard test patterns
  • User-defined AC patterns programming
  • Auto Timing Calibration
  • Application Tests
    1. - Calibration and Self Training
      - AC Switching Noise Simulation
      - Boot Vector (e.g., Boot Vector Patterns)

      Boot Vector Patterns

      TurboCATS has developed a new circuit in the TCIII-3733LPIC system to emulate the platforms boot up sequence. This pattern can detect errors from memory devices during boot up sequence.

      We have also developed two other application patterns as well in the TCIII-3733LPIC test system that can detect errors from the memory devices:

      A) Calibration test: Detects self training problem
      B) High Noise Simulation: Detects any switching noise problem

Powerful Integration Tool

eMCP Function

  • LPDDR4/4x, LPDDR3 and eMMC
  • LPDDR4: 3733Mbps
    1. LPDDR3: 2133Mbps
  • eMMC Application Flow

GUI Failure Analysis

Graphical Identification of Failed DQs' Locations

Represents the failed DQ pins locations, graphically. The software uses a graphical picture to show the test failures at the hardware level: If the IC fails during the test, there would be indications (displayed in RED) marking the failed pin(s) and signal(s).

Address / Data Logging

Error logging can analyze failures by using address and data information.

Bit Failure Mapping

A tool that helps the user to find and display the failed DQ bits in the RAM. The corresponding row and column addresses the failed DQ bits, which will be spotted and displayed for the user.

Shmoo Plot

A two-dimensional diagram that shows the status of the DQ bits of Memory ICs varying over a range of the user's selected parameters (timing and input voltage level).

Pattern Programming Function (optional)

The customer can use a C++ programming language to create a customized AC Command pattern. The programming function also serves as a powerful compiler/debug tool for Pattern programming and allows the user to monitor the timing waveform of the algorithm along with the timing bus transactions. This is all accomplished under the Software.

Specifications: LPDDR4 & LPDDR4x

Test Frequency LPDDR4, 800Mhz to 1600/ 1866 MHz
Switching Data Rate LPDDR4, 1600Mbps to 3200/ 3733 Mbps
I/O Interface LPDDR4, Support LVSTL
Clock Lines 1 pair per site
Address Depth LPDDR4: 17 Rows, 10 Columns, 3 BAs (17X/10Y/3Z) per site
Data Width 16 DQs/ 32 DQs
Termination On-chip, dynamic
Variable Timing Edges tRCD, tCL, tRL, tWL, tAL, tRP, tRFC, tWR, tCWL, etc
Programmable Timing tRCD, tRP, tCCD, tRL, tFAW, tWTR, tRAS, tRTP, tRFC, etc
AC Power Source 110-240V (AC), 50/60Hz
External PC requirements Execute TC-3733LPIC software to control station operation Windows 10, 64-bit, build ver. 2004 operating system or above.
PC Minimum Requirements:
- CPU: Quad-core Intel / AMD CPU with clock freq. at least 3.60 GHz (Intel Core i5-6500 or AMD equivalent)
- RAM: 8 GB, HDD Space: 60GB
- 1920 x 1080 Resolution capable display
Recommended Requirements:
- CPU: Hexa-core Intel / AMD CPU with clock freq. at least 4.00 GHz (Intel Core i5-8400 or AMD equivalent)
- RAM: 16GB, HDD Space:100GB
- 1920 x 1080 Resolution capable display or above
Remark: The configuration of PC will affect the testing efficient.
Recommended Temperature 16°C to 32°C (60.8°F to 89.6°F)
Humidity Limitation 20% to 80%

Specifications: LPDDR3

Test Frequency LPDDR3, 667Mhz to 933Mhz
Switching Data Rate LPDDR3, 1333Mbps to 1866Mbps
I/O Interface LPDDR3, 1.2V HSUL
Clock Lines 1 pair per site
Address Depth LPDDR3: 15 Rows, 12 Columns, 3 BAs (15X/12Y/3Z) per site
Data Width 16 DQs/ 32 DQs
Termination On-chip, dynamic
Variable Timing Edges tRCD, tCL, tRL, tWL, tAL, tRP, tRFC, tWR, tCWL, etc
Programmable Timing tRCD, tRP, tCCD, tRL, tFAW, tWTR, tRAS, tRTP, tRFC, etc

eMMC Specifications:

- Support eMCP Function: LPDDR4/4x, LPDDR3 and eMMC

Speed Mode Supports High Speed, HS200 and HS400
Operating Voltage Vcc Range: 2.35V to 3.3V
VccQ Range: 1.6V to 1.95V
Test Function Interactive Test by eMCP (LPDDR4/4x + eMMC) DUT Board
- DC Patterns Test: LPDDR4/4x only
- Device Functional Test: LPDDR4/4x and eMMC
Individual Test by eMMC DUT Board
- DC Patterns Test: eMMC only
- Device Function Test: eMMC only
Read ID Function CID (Device Identification Register) Read
CSD (Device Specific Data) Read
Extended CSD Register Read
User Function Device Erase, Write and Read function:
- User can define the percentage of Erase/ Write/ Read area in User Test-Pattern programming.

TCIII-3733LPIC & Heat Chamber (optional)

The heat chamber creates a high temperature testing environment to simulate the accelerated life testing and analyze the behaviors of the module.

Heat Chamber Specifications

Power Supply 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption: Power-up : 15A, 220V
Normal operation : 10A, 220V
Display Method 7 Segment LED Display
Processing value (PV) : Green
Setting value (SV) : Red
Display Accuracy: F.S ±0.5% rdg ±1 digit based on SV or 3°C Max.
Sampling Time 0.5 sec. fixed
Vibration: 0.75mm amplitude at frequency of 10-55Hz in each of X, Y, Z directions for 2 hours
Ambient Temperature -10 - 50°C
Storage Temperature -20 - 60°C
Ambient Humidity 35 - 85% RH
Temperature Range 25°C - 85°C
Recommended Setting Temperature 80°C
Air Input Min. 0.5 MPa - Max. 1.0 MPa
Min. 75 psi - 145 psi
Diameter of Gas Tube 6 mm

Software Screenshots

Main Operating Window

Scrip Code Program

Mechanic Information Setting

Shmoo Plot

Test Device

Test Plan

Test List

Security Privilege

TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.