


FEATURES:
Test capabilities
- DDR4 - 1600Mbps, 1866Mbps, 2133Mbps, 2400Mbps, 2667Mbps
- DDR3 - 1333Mbps, 1600Mbps, 1866Mbps, 2133Mbps
- Clock Frequency from 667MHz to 1334MHz
GUI Failure Analysis Tool
- Graphical Failure displays Failed Bad IC's and DQ pins' location
- Error logging location of Row/Column/Blanks/Burst/DQ's for analyze failures
- Address Scramble / Data Scramble
- Optional tools include Bit Failure Mapping & Schmoo Plot to display the failed
Blanks(s) / DQ's bit in the RAM
DC & AC Parametric tests
- Supports ISVM (Contact open pins) and VSIM (Leakage current)
- Supports AC/DC/Idd's parametric test; Continuity, Leakage, Idd's checking
- Over 35 industry standard test patterns and user script pattern programming are available
- Supports SPD programming, Read/Write test, and write-protect, etc.
- Auto Timing Calibration calibrates the tester and performs test on different types of IC's
Flexible Configuration
- Configurable from 6-site to 512-site for parallel testing
- Proper chassis design to meet various selective handlers requirement
- Supports custom load boards for manual test
- Supports None-Cable HiFix for integrating to selective handler interface
- Optional
- Environmental tests from low and high temperatures ranging from -30°C to 125°C
- Heat chamber is available to detect marginal timing and cell storage failures
from 32°C to 85°C with 2°C resolution
Multi-site Networking
Better technology is better business
The new multi-site units can be networked so the user can test up to 512 ICs using one PC to control the entire operation. This gives the customer greater flexibility in terms of increasing testing capacity on as need basis. Cost are minimized since there will be no need for additional man labor to handle the increased capacity.
TCIII-2667IC with Heat Chamber Optional
The heat Chamber creates a hot testing environment to simulate the accelerated life testing and analyze the behaviors of the module.
Heat Chamber Specifications:
Power Supply : | 220V, 50Hz (90 - 110% of rated voltage) |
Power Consumption : | Power-up : 15A, 220V Normal operation : 10A, 220V |
Display Method : | 7 Segment LED Display Processing value (PV) : Green Setting value (SV) : Red |
Display Accuracy : | F.S ±0.5% rdg ±1 digit based on SV or 3°C Max. |
Sampling Time : | 0.5 sec. fixed |
Vibration : | 0.75mm amplitude at frequency of 10-55Hz in each of X, Y, Z directions for 2 hours |
Ambient Temperature : | -10 - 50°C |
Storage Temperature : | -20 - 60°C |
Ambient Humidity : | 35 - 85% RH |
Temperature Range : | 25°C - 85°C |
Recommend Setting Temperature : |
80°C |
Air Input : | Min. 0.5 MPa - Max. 1.0 MPa Min. 75 psi - 145 psi |
Diameter of Gas Tube : | 6 mm |
Dimensions (LxWxH) : | 26.2" (665mm) x 10.4" (265mm) x 37.2" (945mm) |
Powerful Integration Tool
Combination of Failures
- Functional Failure: Cell stuck-at, coupling, neighborhood sensitivity and software error faults
- Parametric Failure: (AC) Speed timing vs. Vdd threshold, (DC) Leakage and Idd's
- Hot-Temperature Failure: System high temperature environment
GUI Failure Analysis
Shmoo Plot
A two-dimensional diagram that shows the status of the DQ bits of Memory ICs varying over a range of the user's selected parameters (timing and input voltage level).
Bit Failure Mapping
A tool that helps the user to find and display the failed DQ bits in the RAM. The corresponding row and column addresses the failed DQ bits, which will be spotted and displayed for the user.
Graphical Identification of DQ's
Represents the failed DQ pins locations, graphically.
The software uses a graphical picture to show the test failures at the hardware level:
If the IC fails during the test, there would be indications (displayed in RED) marking the
failed pin(s) and signal(s).
Script Code Function Optional
TurboCATS Limited designed a new feature called the Script Code in the new DDR3/DDR4 test system, the TCIII-2667IC test system. In the new system, the user can use the script programming language to create a customized test pattern. It can support up to maximum 2048 data patterns (optional). Once the pattern is created, the Script Code pattern generator/compiler is used to compile the code and then generate the new test pattern.
Script Code Debugger
The Script Code function also serves as a powerful compiler/debug tool. It contains a built-in compiler and debugger for the Script Code programming which allows the customer to monitor the timing waveform of the programming algorithm as well as the timing bus transactions. This is all accomplished under the Signal Tap tool.
The new pattern is then imported into the test list and gives the customer a customized pattern with AC (tSU, tWD, tSAC, tRCD, tCL, tAL, tWR, tRP, tRC, tREF, tRFC, etc.) and DC (Vdd, Vref) parameters for testing their product. In addition to the above, the customer can also create a motherboard test pattern algorithm using the Script Code function.
Handler Interface Optional
- TurboCATS Series testers support both manual and automated handler testing
- It can be integrated to various handlers with/ without the None-Cable HiFix

M6771AD / M6741AD Handler
- DDR4 / DDR3 up to 64 DUT's or 128 DUT's

HT-3309 Handler
- DDR3 / DDR4 up to 256 DUT's
AC SPECIFICATIONS:
Test Frequency | DDR3 DDR4 |
667Mhz to 1067Mhz 800Mhz to 2667Mhz |
|
Switching Data Rate | DDR3 DDR4 |
1333Mbps to 2133Mbps 1600Mbps to 2667Mbps |
|
I/O Interface | DDR3 | SSTL-15, Class I & Class II SSTL-135, Class I & Class II |
|
DDR4 | POD-12, 1.2V Pseudo Open Drain I/O | ||
Clock Lines | 1 pair per site | ||
Address Depth | DDR3 | 16 Rows, 15 Columns, 3 Banks 16X/15Y/3Z per site |
|
DDR4 | 18 Rows, 15 Columns, 4 Banks 18X/15Y/4Z per site |
||
Data Width | 8 I/O; Supports 4 / 8 / 16 / 32 bit IC devices | ||
DQS's | Differential | ||
Control Lines | DDR3, DDR4 |
2 CS's, 2 CLKE, 1 RAS, 1 CAS, 1 WE | |
Termination | On-chip, dynamic | ||
Variable Timing Edges | tSU/tHD, tWD, tDQSS, tAC, etc. | ||
Programmable Timing | DDR3, DDR4 |
tRCD, tCL, tRL, tWL, tAL, tRP, tRFC, tWR, tCWL, etc. | |
SPD Programming | Read, Program, Edit, Test Byte Matching, Serialization, Write Protect, Slot Test, etc. |
||
Min. Control PC Requirement | Windows 7 or better, Networking interface | ||
Unit Dimensions (LxWxH) * Approximate |
6-site : 13" (330mm) x 9.1" (230mm) x 12.6" (320mm) | ||
Unit Weight * Approximate |
6-site : 19.8 lbs (9 kg) | ||
AC Power Source | 110-240VAC, 50/60Hz |
Software Screenshots
- Main Operating Window
- Test Device Configuration
- Test Plan
- Shmoo Plot Dot