NEW ! Series of Configurable testing up to 512 sites
 
 
 
 

FEATURES:

Test capabilities

 
  • DDR4 - 1600Mbps, 1866Mbps, 2133Mbps, 2400Mbps, 2667Mbps
  • DDR3 - 1333Mbps, 1600Mbps, 1866Mbps, 2133Mbps
  • Clock Frequency from 667MHz to 1334MHz
 

GUI Failure Analysis Tool

 
  • Graphical Failure displays Failed Bad IC's and DQ pins' location
  • Error logging location of Row/Column/Blanks/Burst/DQ's for analyze failures
  • Address Scramble / Data Scramble
  • Optional tools include Bit Failure Mapping & Schmoo Plot to display the failed
    Blanks(s) / DQ's bit in the RAM
 

DC & AC Parametric tests

 
  • Supports ISVM (Contact open pins) and VSIM (Leakage current)
  • Supports AC/DC/Idd's parametric test; Continuity, Leakage, Idd's checking
  • Over 35 industry standard test patterns and user script pattern programming are available
  • Supports SPD programming, Read/Write test, and write-protect, etc.
  • Auto Timing Calibration calibrates the tester and performs test on different types of IC's
 

Flexible Configuration

 
  • Configurable from 6-site to 512-site for parallel testing
  • Proper chassis design to meet various selective handlers requirement
  • Supports custom load boards for manual test
  • Supports None-Cable HiFix for integrating to selective handler interface
  • Optional
    • Environmental tests from low and high temperatures ranging from -30°C to 125°C
    • Heat chamber is available to detect marginal timing and cell storage failures
      from 32°C to 85°C with 2°C resolution
 
 
 
 

Multi-site Networking

Better technology is better business

 
 

 

The new multi-site units can be networked so the user can test up to 512 ICs using one PC to control the entire operation. This gives the customer greater flexibility in terms of increasing testing capacity on as need basis. Cost are minimized since there will be no need for additional man labor to handle the increased capacity.

 
 
 

TCIII-2667IC with Heat Chamber Optional

The heat Chamber creates a hot testing environment to simulate the accelerated life testing and analyze the behaviors of the module.

 

Heat Chamber Specifications:

 
Power Supply : 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption : Power-up : 15A, 220V
Normal operation : 10A, 220V
Display Method : 7 Segment LED Display
Processing value (PV) : Green
Setting value (SV) : Red
Display Accuracy : F.S ±0.5% rdg ±1 digit based on SV or 3°C Max.
Sampling Time : 0.5 sec. fixed
Vibration : 0.75mm amplitude at frequency of 10-55Hz in each of X, Y, Z directions for 2 hours
Ambient Temperature : -10 - 50°C
Storage Temperature : -20 - 60°C
Ambient Humidity : 35 - 85% RH
Temperature Range : 25°C - 85°C
Recommend Setting
Temperature :
80°C
Air Input : Min. 0.5 MPa - Max. 1.0 MPa
Min. 75 psi - 145 psi
Diameter of Gas Tube : 6 mm
Dimensions (LxWxH) : 26.2" (665mm) x 10.4" (265mm) x 37.2" (945mm)
 
 
 

Powerful Integration Tool

 

Combination of Failures

 
  • Functional Failure: Cell stuck-at, coupling, neighborhood sensitivity and software error faults
  • Parametric Failure: (AC) Speed timing vs. Vdd threshold, (DC) Leakage and Idd's
  • Hot-Temperature Failure: System high temperature environment
 
 
 

GUI Failure Analysis

 

Shmoo Plot

A two-dimensional diagram that shows the status of the DQ bits of Memory ICs varying over a range of the user's selected parameters (timing and input voltage level).

 

 
 
 

Bit Failure Mapping

A tool that helps the user to find and display the failed DQ bits in the RAM. The corresponding row and column addresses the failed DQ bits, which will be spotted and displayed for the user.

 

 
 
 

Graphical Identification of DQ's

Represents the failed DQ pins locations, graphically.
The software uses a graphical picture to show the test failures at the hardware level:

If the IC fails during the test, there would be indications (displayed in RED) marking the
failed pin(s) and signal(s).

 

 
 
 

Script Code Function Optional

TurboCATS Limited designed a new feature called the Script Code in the new DDR3/DDR4 test system, the TCIII-2667IC test system. In the new system, the user can use the script programming language to create a customized test pattern. It can support up to maximum 2048 data patterns (optional). Once the pattern is created, the Script Code pattern generator/compiler is used to compile the code and then generate the new test pattern.

 

Script Code Debugger

 

The Script Code function also serves as a powerful compiler/debug tool. It contains a built-in compiler and debugger for the Script Code programming which allows the customer to monitor the timing waveform of the programming algorithm as well as the timing bus transactions. This is all accomplished under the Signal Tap tool.

The new pattern is then imported into the test list and gives the customer a customized pattern with AC (tSU, tWD, tSAC, tRCD, tCL, tAL, tWR, tRP, tRC, tREF, tRFC, etc.) and DC (Vdd, Vref) parameters for testing their product. In addition to the above, the customer can also create a motherboard test pattern algorithm using the Script Code function.

 
 
 

Handler Interface Optional

 
  • TurboCATS Series testers support both manual and automated handler testing
  • It can be integrated to various handlers with/ without the None-Cable HiFix
 

 
M6771AD / M6741AD Handler
  • DDR4 / DDR3 up to 64 DUT's or 128 DUT's
HT-3309 Handler
  • DDR3 / DDR4 up to 256 DUT's
 
 
 

AC SPECIFICATIONS:

 
Test Frequency DDR3
DDR4
667Mhz to 1067Mhz
800Mhz to 2667Mhz
Switching Data Rate DDR3
DDR4
1333Mbps to 2133Mbps
1600Mbps to 2667Mbps
I/O Interface DDR3 SSTL-15, Class I & Class II
SSTL-135, Class I & Class II
DDR4 POD-12, 1.2V Pseudo Open Drain I/O
Clock Lines 1 pair per site
Address Depth DDR3 16 Rows, 15 Columns, 3 Banks
16X/15Y/3Z per site
DDR4 18 Rows, 15 Columns, 4 Banks
18X/15Y/4Z per site
Data Width 8 I/O; Supports 4 / 8 / 16 / 32 bit IC devices
DQS's Differential
Control Lines DDR3,
DDR4
2 CS's, 2 CLKE, 1 RAS, 1 CAS, 1 WE
Termination On-chip, dynamic
Variable Timing Edges tSU/tHD, tWD, tDQSS, tAC, etc.
Programmable Timing DDR3,
DDR4
tRCD, tCL, tRL, tWL, tAL, tRP, tRFC, tWR, tCWL, etc.
SPD Programming Read, Program, Edit, Test Byte Matching, Serialization, Write Protect,
Slot Test, etc.
Min. Control PC Requirement Windows 7 or better, Networking interface
Unit Dimensions (LxWxH)
* Approximate
6-site : 13" (330mm) x 9.1" (230mm) x 12.6" (320mm)
Unit Weight
* Approximate
6-site : 19.8 lbs (9 kg)
AC Power Source 110-240VAC, 50/60Hz
 
 
 

Software Screenshots

  • Main Operating Window

  • Test Device Configuration
 

  • Test Plan

  • Shmoo Plot Dot