At Bus Speed & High Data Rate Switching

DDR4 / 2667Mbps & DDR3 / 2133Mbps

"Low Cost" and "High Performance" are two phrases you typically do not see associated with memory test systems. This all changes with TurboCATS's TCE-2667. With the "Single DUT" and at speeds up to 2667Mbps, the memory test system is equipped with industry-standard features essential for memory productivity.

Features like "At Bus Speed Testing" and support for "High Data Rate Switching" are now standard functions in the new TCE-2667. Open/Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to ensure that the products they sell meet the standards of the PC industry. TCE-2667 is the answer to cost effective, high performing DDR3 and DDR4 testing for all levels. Repair shops, system integrators, resellers, VARS/VADS, production floors, etc. now have a viable choice when it comes to testing high speed memory modules.


Mobility, Reliability and Flexibility




Test Capabilities:

DDR4 tests data bandwidth up to 2667Mbps
DDR3 tests data bandwidth up to 2133Mbps
Enhanced bus cycles at speed testing
Supports high bandwidth data switching

Analysis Test:

Real time Idd monitoring
Supports DC/Idd's/AC tests
Vdd shorted protection
Open/Shorts plus 10 comprehensive AC patterns
Vdd shorted protection
SPD program/test/read, byte matching, write protection, slot test and serialization

Flexible Configuration:

Supports DDR3L (Low voltage DDR3)
Unbuffered and Registered DIMM's
Optional Form-factor adapters
Networking interface connecting up to 8 units

NEW ! TCE-2667 and heat chamber Optional

Network-ready & High-Performace


Heat Chamber Specifications:

Power Supply (Main Power) : 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption (Main Power) : Power-up: 3A, 220V
Normal operation: 1.3A, 220V
Display Method : Red 7 Segment LED Display
Storage Temperature : -20°C - 60°C
Ambient Humidity : 35% - 85% RH
Temperature Range : 25°C - 85°C

Speeds continue to increase in the ever-changing memory market. Moreover, customers want this speed packed in smaller units. The faster the speed is generated, the more heat will be produced, therefore becoming a major challenge in the tester's performance.

TurboCATS has innovated a new heat chamber that can be integrated with the TCE-2667 DDR4 and DDR3 tester. This allows for a module and its components to be tested for functionality while being exposed to similar heat conditions to the temperature within a PC laptop. This optional item is available with the single site TCE-2667 tester.


Mobility & Reliability at an Affordable Price


  • Ideal for powered productivity
  • Graphical user interface software
  • Easy configuration
  • Share effectively and networking
  • Optional heat chamber
  • Optional handler interface


DDR4 clock frequencies: 800 to 1334 Mhz
DDR4 data rate: 1600, 1866, 2133, 2400, 2667 Mbps
DDR3 clock frequencies: 667 to 1067 MHz
DDR3 data rate: 1333, 1600, 1866, 2133 Mbps
DDR4 Vdd - 1.14V to 1.30V
DDR3L Vdd - 1.25V to 1.45V
DDR3 Vdd - 1.35V to 1.65V
Data width: 72 bits in parallel
Address depth: DDR4 - 18 Rows, 15 Columns, 4 BAs
 DDR3 - 16 Rows, 15 Columns, 3 BAs
Programmable timing cycles : tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC, etc.
Burst Length: 8
ODT Selection
OCD Adjustment: Auto calibration
All Standard Idd's tests

Software Screenshots

  • Quick Test (default by factory)

  • Test Device Configuration


  • SPD Data

  • Security Privilege