Enhanced Bus Speed & High Bandwidth Switching

Can be configured up to 32 sites in parallel and integrated to the selected handler


Speeds continue to increase in the ever changing memory market. Along with the demand for faster speeds, customers also want their technology to packaged smaller. With both of these demands, memory manufacturers are faced with another obstacle: heat. As speeds continue to build momentum, heat gets built up and therefore obstruct the smaller packaged machine in performing as well.

To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-2133-LP LPDDR3 and LPDDR2 tester. This allows the module and its components to be tested while being exposed to heat conditions similar to what might be encountered in a PC laptop. This optional product is available with the single site TCE-2133-LP tester.


Testing LPDDR3 & LPDDR2 up to 1866Mbps

Multi-Site Memory Test System



Supports LPDDR3/LPDDR2 x16 bits or x32 bits devices
LPDDR3 tests data bandwidth up to 1866Mbps
LPDDR2 tests data bandwidth up to 1066Mbps
Tests up to 4 DUTs in parallel
Enhanced bus cycles at speed testing
Supports high bandwidth data switching
Vdd shorted protection
Comprehensive Industrial AC test patterns
Real time Idd monitoring
Idd's tests
Networking interface connects up to 8 units

NEW ! LPDDR3 / LPDDR2 x16 bits or x32 bit devices

Test up to 4 DUTs in parallel


Control up to 8 TCE-2133-LP with a single PC

Reach Higher Levels of Performance



NEW ! Expand your reach with the advanced TCE-2133-LP and heat chamber

Don't let old technology keep you from getting ahead


Heat Chamber Specifications:

Power Supply (Main Power) : 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption (Main Power) : Power-up: 3A, 220V
Normal operation: 1.3A, 220V
Display Method : Red 7 Segment LED Display
Storage Temperature : -20 - 60°C
Ambient Humidity : 35 - 85% RH
Temperature Range : 25 - 85°C
Dimensions (LxWxH) : 12.8" (325mm) x 11.8" (300mm) x 19.9" (505mm)


LPDDR3 clock frequencies (MHz): 667, 800, 933
LPDDR3 data rate (Mbps): 1333, 1600, 1866
LPDDR2 clock frequencies (MHz): 333, 400, 533
LPDDR2 data rate (Mbps): 667, 800, 1066
Vdd1: 1.70V ~ 1.95V, resolution 0.001V, 1.5A/DUT, +/- 1%
Vdd2/Vddq/Vddca: 1.14V ~ 1.30V, resolution 0.001V, 1.5A/DUT, +/- 1%
Vref: 0.50V ~ 1.50V, resolution 0.001V, +/- 1%
Data width: 4 / 8 / 16 / 32 bit IC devices
Address depth: 14 Rows, 10 Columns, 3 BAs
Control Signal: 2 CKE/ 2 CSn/ CA0-9
Programmable timing cycles : tRCD, tBL, tWL, tRL, tWR, tRFC, tRC, etc.
Burst Length: 8
ODT Selection support
All Standard Idd's tests according to JEDEC specifications
Minimum PC requirement: Windows 7 or better, Networking Interface
Dimensions (WxDxH): 13.0" (330mm) x 9.1" (230mm) x 13.0" (330mm)

Software Screenshots

  • Main Operating Window

  • Test File Configuration


  • SPD Data

  • Security Privilege