TCE-2133 DDR4/3 Module Test System

Don't let old technology keep you from getting ahead


Reliability and Engineering

With the Single DUT and at speeds up to 2133Mbps, the memory test system is equipped with industry-standard features essential for memory productivity. Features like At Bus Speed Testing and support for High Data Rate Switching are now standard functions in the TCE-2133 test system. Open/Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to ensure that the products they sell meet the standards of the PC industry. TCE-2133 tester is the answer to cost effective, high performing DDR3 and DDR4 testing for all levels.

Powerful TCE-2133 and Heat Chamber

Network-ready and High-Performance

Reliability and Performance Testing

  • Easy installation and manageability
  • Graphical configuration software
  • Cost-effective files sharing and networking
  • Optional heat chamber
  • Optional handler interface


DDR4 tests data bandwidth up to 2133Mbps
DDR3 tests data bandwidth up to 1866Mbps
Supports DDR3L (Low voltage DDR3)
Enhanced bus cycles at speed testing
Supports high bandwidth data switching
Real time Idd monitoring
Vdd shorted protection
Open/Shorts plus 10 comprehensive AC patterns
Idd's tests
SPD program/test/read, byte matching, write protection, slot test and serialization
Unbuffered and Registered DIMM's
Optional Form-factor adapters
Networking interface connecting up to 8 units


DDR4 clock frequencies (Mhz): 800, 933, 1067
DDR4 data rate (Mbps): 1600, 1866, 2133
DDR3 clock frequencies (Mhz): 667, 800, 933
DDR3 data rate (Mbps): 1333, 1600, 1866
DDR4 Vdd - 1.14V to 1.30V
DDR3L Vdd - 1.25V to 1.45V
DDR3 Vdd - 1.35V to 1.65V
Data width: 72 bits in parallel
Address depth: DDR4 - 18 Rows, 15 Columns, 4 BAs
 DDR3 - 16 Rows, 15 Columns, 3 BAs
Programmable timing cycles: tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC
Burst Length: 8
ODT Selection
OCD Adjustment: Auto calibration
All Standard Idd's tests

Powerful TCE-2133 and Heat Chamber (optional)

Ideal Solution for High-performance Testing

Speeds continue to increase in the ever changing memory market. Along with the demand for faster speeds, customers also want smaller packages for their technology.

With both of these demands, memory manufacturers are faced with another obstacle: heat. As speeds continue to build momentum, heat gets built up and therefore obstruct the smaller packaged machine in performing as well.

To assist manufacturers, and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-2133 DDR4/DDR3 tester. This allows the module and its components to be tested while being exposed to heat conditions similar to what might be encountered in a PC laptop.


Power Supply 220V, 50Hz (90 - 110% of rated voltage)
Power Consumption Power-up: 3A, 220V
Normal operation: 1.3A, 220V
Display Method Red 7 Segment LED Display
Storage Temperature -20°C - 60°C
Ambient Humidity 35% - 85% RH
Temperature Range 25°C - 85°C

Software Screenshots:

Quick Test (default by factory)

Test Device Configuration

SPD Data

Security Privilege

TURBOCATS, LTD. RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.